Double synchronous-step-down-stress accelerated life testing method

doi:10.3969/j.issn.1001-0548.2016.03.027

CORC > 兰州理工大学 > 兰州理工大学 > 机电工程学院

	Double synchronous-step-down-stress accelerated life testing method
	Kou, Hai-Xia; An, Zong-Wen; Liu, Bo
刊名	Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China
	2016-03-30
卷号	45 期号:2 页码:316-320
关键词	Efficiency Electron emission Numerical methods Reliability Testing Weibull distribution Accelerated life testing Accelerated life tests Accelerated stress High reliability Reliability engineering Reliability Evaluation Step down Test efficiency
ISSN号	10010548
DOI	10.3969/j.issn.1001-0548.2016.03.027
英文摘要	Reliability evaluation for products of high-reliability and long-lifetime is one of the challenges in reliability engineering. A method of double synchronous-step-down-stress accelerated life testing (DSSDS-ALT) is proposed by considering the long testing time and low efficiency of the double cross-step-down-stress accelerated life testing (DCSDS-ALT). The method uses the drop way of synchronous-step-down for two accelerated stress to form a sloping down trajectory, so it can improve the test efficiency and the whole test state. Numerical simulation was made for the DSSDS-ALT with Monte Carlo method for products whose lifetime follows Weibull distribution. The results indicate that DSSDS-ALT can save testing time and improve efficiency of the test. © 2016, Editorial Board of Journal of the University of Electronic Science and Technology of China. All right reserved.
语种	中文
出版者	Univ. of Electronic Science and Technology of China
内容类型	期刊论文
源URL	[http://ir.lut.edu.cn/handle/2XXMBERH/112539]
专题	机电工程学院
作者单位	School of Mechatronics Engineering, Lanzhou University of Technology, Lanzhou; 730050, China
推荐引用方式 GB/T 7714	Kou, Hai-Xia,An, Zong-Wen,Liu, Bo. Double synchronous-step-down-stress accelerated life testing method[J]. Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China,2016,45(2):316-320.
APA	Kou, Hai-Xia,An, Zong-Wen,&Liu, Bo.(2016).Double synchronous-step-down-stress accelerated life testing method.Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China,45(2),316-320.
MLA	Kou, Hai-Xia,et al."Double synchronous-step-down-stress accelerated life testing method".Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China 45.2(2016):316-320.