Annihilation mechanism of excitons in a MoS2 monolayer through direct Forster-type energy transfer and multistep diffusion | |
K. J. Lee, W. Xin and C. L. Guo | |
刊名 | Physical Review B |
2020 | |
卷号 | 101期号:19页码:9 |
ISSN号 | 2469-9950 |
DOI | 10.1103/PhysRevB.101.195407 |
英文摘要 | An atomically thin MoS2 layer is a direct bandgap semiconductor exhibiting strong electron-hole interaction due to the extreme quantum confinement and reduced screening of Coulomb interactions, which results in the formation of stable excitons at room temperature. Therefore, various excitonic properties of the MoS2 monolayer are extremely important in determining the strength of light-matter interactions including their radiative recombination lifetime and optoelectronic response. In this paper, we report a comprehensive study of the underlying annihilation mechanism of various types of exciton in the MoS2 monolayer using the transient absorption spectroscopy. We rigorously demonstrate that the Forster-type resonance energy transfer is the main annihilation mechanism of A and Bexcitons, while the multistep diffusion process is responsible for C-exciton annihilation, which is supported by critical scientific evidence. |
URL标识 | 查看原文 |
语种 | 英语 |
内容类型 | 期刊论文 |
源URL | [http://ir.ciomp.ac.cn/handle/181722/64311] |
专题 | 中国科学院长春光学精密机械与物理研究所 |
推荐引用方式 GB/T 7714 | K. J. Lee, W. Xin and C. L. Guo. Annihilation mechanism of excitons in a MoS2 monolayer through direct Forster-type energy transfer and multistep diffusion[J]. Physical Review B,2020,101(19):9. |
APA | K. J. Lee, W. Xin and C. L. Guo.(2020).Annihilation mechanism of excitons in a MoS2 monolayer through direct Forster-type energy transfer and multistep diffusion.Physical Review B,101(19),9. |
MLA | K. J. Lee, W. Xin and C. L. Guo."Annihilation mechanism of excitons in a MoS2 monolayer through direct Forster-type energy transfer and multistep diffusion".Physical Review B 101.19(2020):9. |
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