Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips

doi:10.1177/0003702818798044

CORC > 长春光学精密机械与物理研究所 > 中国科学院长春光学精密机械与物理研究所

	Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips
	Y.Xu; Y.H.Wu; J.F.Wu; M.B.Chi
刊名	Applied Spectroscopy
	2019
卷号	73 期号:1 页码:40-46
关键词	Ultraviolet-visible,UV-Vis spectrophotometry,multiwavelength linear,regression,MLR,centrifugal microfluidic chip,surface roughness,scattering,Instruments & Instrumentation,Spectroscopy
ISSN号	0003-7028
DOI	10.1177/0003702818798044
英文摘要	An ultraviolet visible (UV-Vis) spectrophotometric and multiwavelength linear regression (MLR) method was developed for eliminating the influence of the surface quality of centrifugal microfluidic chips on the accuracy of their absorbance detection. The regression model is based on scalar scattering theory. The method was validated with cuvettes with different surface quality and Orange G (orange gelb) dye. The coefficients of variation (CVs) of the predicted solution concentration ratios in different cuvettes were < 1%, and the relative errors were < 1.5%. The model was shown to have higher accuracy and precision than that of traditional methods.
语种	英语
内容类型	期刊论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/62908]
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	Y.Xu,Y.H.Wu,J.F.Wu,et al. Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips[J]. Applied Spectroscopy,2019,73(1):40-46.
APA	Y.Xu,Y.H.Wu,J.F.Wu,&M.B.Chi.(2019).Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips.Applied Spectroscopy,73(1),40-46.
MLA	Y.Xu,et al."Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips".Applied Spectroscopy 73.1(2019):40-46.