A 3.0 THz detector in 65 nm standard CMOS process

	A 3.0 THz detector in 65 nm standard CMOS process
	FANG Tong; LIU Li-Yuan ; LIU Zhao-Yang; FENG Peng; LI Yuan-Yuan; LIU Jun-Qi; LIU Jian; WU Nan-Jian
刊名	JOURNAL OF INFRARED AND MILLIMETER WAVES
	2020
卷号	39 期号:1 页码:56-64
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/30632]
专题	半导体研究所_半导体超晶格国家重点实验室
推荐引用方式 GB/T 7714	FANG Tong; LIU Li-Yuan ; LIU Zhao-Yang; FENG Peng; LI Yuan-Yuan; LIU Jun-Qi; LIU Jian; WU Nan-Jian. A 3.0 THz detector in 65 nm standard CMOS process[J]. JOURNAL OF INFRARED AND MILLIMETER WAVES,2020,39(1):56-64.
APA	FANG Tong; LIU Li-Yuan ; LIU Zhao-Yang; FENG Peng; LI Yuan-Yuan; LIU Jun-Qi; LIU Jian; WU Nan-Jian.(2020).A 3.0 THz detector in 65 nm standard CMOS process.JOURNAL OF INFRARED AND MILLIMETER WAVES,39(1),56-64.
MLA	FANG Tong; LIU Li-Yuan ; LIU Zhao-Yang; FENG Peng; LI Yuan-Yuan; LIU Jun-Qi; LIU Jian; WU Nan-Jian."A 3.0 THz detector in 65 nm standard CMOS process".JOURNAL OF INFRARED AND MILLIMETER WAVES 39.1(2020):56-64.