Degradation analysis and optimization of temperature effect on MEMRISTOR-based Neural Network Accelerators by electro-thermal simulation | |
Shang,Mengjun1; Yin,Longxiang2; Xu,Ning1 | |
刊名 | Journal of Physics: Conference Series |
2021-02-01 | |
卷号 | 1812期号:1 |
ISSN号 | 1742-6588 |
DOI | 10.1088/1742-6596/1812/1/012025 |
英文摘要 | Abstract Nowadays, memristor-based neural network accelerators have been widely studied due to their outstanding performance in massive parallel vector matrix multiplication. However, the memristor is sensitive to temperature and its on/off state operation window can be seriously degraded by the increasing temperature, which may lead to computation failures in memristor -based NN accelerators. In this work, we establish an electro-thermal simulation platform to evaluate the temperature impact on memristor -based NN accelerators. With this platform, we first investigate the impact on computation accuracy with the temperature increase in different NN layers in the accelerators. We then apply a temperature-aware NN weight mapping scheme to the most temperature-sensitive layer and achieve 28.89% improvement in computation accuracy, which only has 0.06% difference with the improvement achieved by applied the mapping scheme to the whole NN model. This finding can help to simplify the temperature-aware hardware optimization design in memristor-based neural network accelerators and reduce the power consumption. |
语种 | 英语 |
出版者 | IOP Publishing |
WOS记录号 | IOP:1742-6588-1812-1-012025 |
内容类型 | 期刊论文 |
源URL | [http://119.78.100.204/handle/2XEOYT63/16247] |
专题 | 中国科学院计算技术研究所 |
作者单位 | 1.School of Information Engineering, Wuhan University of Technology, Wuhan, China 2.State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China |
推荐引用方式 GB/T 7714 | Shang,Mengjun,Yin,Longxiang,Xu,Ning. Degradation analysis and optimization of temperature effect on MEMRISTOR-based Neural Network Accelerators by electro-thermal simulation[J]. Journal of Physics: Conference Series,2021,1812(1). |
APA | Shang,Mengjun,Yin,Longxiang,&Xu,Ning.(2021).Degradation analysis and optimization of temperature effect on MEMRISTOR-based Neural Network Accelerators by electro-thermal simulation.Journal of Physics: Conference Series,1812(1). |
MLA | Shang,Mengjun,et al."Degradation analysis and optimization of temperature effect on MEMRISTOR-based Neural Network Accelerators by electro-thermal simulation".Journal of Physics: Conference Series 1812.1(2021). |
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