Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*

doi:10.1088/1674-1056/abad1e

	Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*
	Xu, Li-Jun 1,2; Zhai, Peng-Fei 1,2; Zhang, Sheng-Xia 2; Zeng, Jian 1,2; Hu, Pei-Pei 2; Li, Zong-Zhen 1,2; Liu, Li 1,2; Sun, You-Mei 1,2; Liu, Jie 1,2
刊名	CHINESE PHYSICS B
	2020-09-01
卷号	29 期号:10 页码:5
关键词	ion track MoS2 transmission electron microscopy (TEM) recrystallization
ISSN号	1674-1056
DOI	10.1088/1674-1056/abad1e
通讯作者	Zhai, Peng-Fei(zhaipengfei@impcas.ac.cn) ; Liu, Jie(j.liu@impcas.ac.cn)
英文摘要	The various morphologies of tracks in MoS(2)irradiated by swift heavy ions at normal and 30 degrees incidence with 9.5-25.0 MeV/u(86)Kr,Xe-129,Ta-181, and(209)Bi ions were investigated by transmission electron microscopy. The diameter of ion tracks increases from 1.9 nm to 4.5 nm with increasing electronic energy loss. The energy loss threshold of the track formation in MoS(2)is predicted as about 9.7 keV/nm based on the thermal spike model and it seems consistent with the experimental results. It is shown that the morphology of ion tracks is related to the penetration length of ions in MoS2. The formation process of ion tracks is discussed based on the cooperative process of outflow and recrystallization of the molten phase during rapid quenching.
资助项目	National Natural Science Foundation of China[11675233] ; National Natural Science Foundation of China[11690041] ; National Natural Science Foundation of China[11405229] ; National Natural Science Foundation of China[11705246] ; National Natural Science Foundation of China[11505243] ; Chinese Academy of Sciences ; Youth Innovation Promotion Association of Chinese Academy of Sciences[2020412]
WOS关键词	MAGNETIC INSULATORS ; IRRADIATION
WOS研究方向	Physics
语种	英语
出版者	IOP PUBLISHING LTD
WOS记录号	WOS:000575561200001
资助机构	National Natural Science Foundation of China ; Chinese Academy of Sciences ; Youth Innovation Promotion Association of Chinese Academy of Sciences
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/139440]
专题	中国科学院近代物理研究所
通讯作者	Zhai, Peng-Fei; Liu, Jie
作者单位	1.Univ Chinese Acad Sci, Sch Nucl Sci & Technol, Beijing 100049, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
推荐引用方式 GB/T 7714	Xu, Li-Jun,Zhai, Peng-Fei,Zhang, Sheng-Xia,et al. Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*[J]. CHINESE PHYSICS B,2020,29(10):5.
APA	Xu, Li-Jun.,Zhai, Peng-Fei.,Zhang, Sheng-Xia.,Zeng, Jian.,Hu, Pei-Pei.,...&Liu, Jie.(2020).Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*.CHINESE PHYSICS B,29(10),5.
MLA	Xu, Li-Jun,et al."Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*".CHINESE PHYSICS B 29.10(2020):5.