A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction

doi:10.1109/TIM.2020.3038413

CORC > 自动化研究所 > 中国科学院自动化研究所 > 精密感知与控制研究中心 > 精密感知与控制

	A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction
	Lv, Chengkan 1,2; Shen, Fei 1,2,3; Zhang, Zhengtao 1,2,3; Xu, De 1,2; He, Yonghao 1,2,3
刊名	IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
	2021
卷号	70 页码:13
关键词	Anomaly detection autoencoder background reconstruction defect inspection
ISSN号	0018-9456
DOI	10.1109/TIM.2020.3038413
通讯作者	Zhang, Zhengtao(zhengtao.zhang@ia.ac.cn)
英文摘要	In this article, an anomaly detection method based on background reconstruction is proposed to perform defect inspection on the texture surface of the industrial products. This method consists of two modules: 1) an autoencoder integrated with a generative adversarial network is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, extra anomalous images are introduced and a mapping method of anomaly is given to improve the stability of reconstruction. 2) A U-net based inspection network is trained to perform pixel-wise analysis of the differences between the original and the reconstructed defect-free image. During these processes, only artificial synthesized defective images are utilized to train the model without any real defective samples. A series of experiments are conducted on several texture image data sets and the industrial production line. The experimental results reveal the effectiveness and versatility of the proposed method.
资助项目	Youth Innovation Promotion Association, CAS[2020139]
WOS关键词	ANOMALY DETECTION
WOS研究方向	Engineering ; Instruments & Instrumentation
语种	英语
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号	WOS:000691803600035
资助机构	Youth Innovation Promotion Association, CAS
内容类型	期刊论文
源URL	[http://ir.ia.ac.cn/handle/173211/45935]
专题	精密感知与控制研究中心_精密感知与控制
通讯作者	Zhang, Zhengtao
作者单位	1.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Sch Artificial Intelligence, Beijing 100049, Peoples R China 3.CASI Vis Technol Co Ltd, Luoyang 471000, Peoples R China
推荐引用方式 GB/T 7714	Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,et al. A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2021,70:13.
APA	Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,Xu, De,&He, Yonghao.(2021).A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,70,13.
MLA	Lv, Chengkan,et al."A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 70(2021):13.