Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films

doi:10.1088/0953-8984/21/48/485901

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	Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films
	Guo, Y. Y.2; Wei, T.2; He, Q. Y.3; Liu, J-M 1,2,3
刊名	JOURNAL OF PHYSICS-CONDENSED MATTER
	2009-12-02
卷号	21 期号:48 页码:8
ISSN号	0953-8984
DOI	10.1088/0953-8984/21/48/485901
通讯作者	Liu, J-M(liujm@nju.edu.cn)
英文摘要	We measure systematically the intrinsic scaling behavior of dynamic hysteresis for Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 (PBZT) ferroelectric thin films with Pt electrodes on Si substrates, utilizing the Sawyer-Tower technique. For the as-prepared thin films of similar thickness and microstructure, over the low frequency range, the scaling follows the power law < A > proportional to f(0.28)E(0)(0.91) under low E-0 and the power law < A > proportional to f(0.35)E(0)(0.78) under high E-0, where < A > is the hysteresis area, and f and E-0 are the frequency and amplitude of the external electric field. In the high-f range, the power law for low E0 takes the form of < A > proportional to f(-0.32)E(0)(3.2), while that for high E-0 takes the form of < A > proportional to f(-0.2)E(0)(2.2). It is identified that the dynamic behaviors at low frequency mainly come from the intrinsic domain reversal instead of others like the leakage current, while the depolarization field may influence the frequency exponents at high frequency. We study the temperature scaling of the hysteresis, indicating that the scaling under low E-0 is roughly consistent with the (Phi(2))(2) model. Finally, we argue that experimentally obtained power law scaling for Pb(Zr0.52Ti0.48)O-3 thin films prepared under the given conditions may not be reliable due to the polarization fatigue effect.
资助项目	National Natural Science Foundation of China[50832002] ; National Natural Science Foundation of China[10674061] ; National Natural Science Foundation of China[50572038] ; National Key Projects for Basic Researches of China[2009CB623303]
WOS研究方向	Physics
语种	英语
出版者	IOP PUBLISHING LTD
WOS记录号	WOS:000271662800025
资助机构	National Natural Science Foundation of China ; National Key Projects for Basic Researches of China
内容类型	期刊论文
源URL	[http://ir.imr.ac.cn/handle/321006/98686]
专题	金属研究所_中国科学院金属研究所
通讯作者	Liu, J-M
作者单位	1.Chinese Acad Sci, Int Ctr Mat Phys, Shenyang, Peoples R China 2.Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China 3.S China Normal Univ, Sch Phys, Guangzhou 510006, Guangdong, Peoples R China
推荐引用方式 GB/T 7714	Guo, Y. Y.,Wei, T.,He, Q. Y.,et al. Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films[J]. JOURNAL OF PHYSICS-CONDENSED MATTER,2009,21(48):8.
APA	Guo, Y. Y.,Wei, T.,He, Q. Y.,&Liu, J-M.(2009).Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films.JOURNAL OF PHYSICS-CONDENSED MATTER,21(48),8.
MLA	Guo, Y. Y.,et al."Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films".JOURNAL OF PHYSICS-CONDENSED MATTER 21.48(2009):8.