Betatron Phase Advance Measurements Using the Gated Turn-by-turn Monitors at SuperKEKB

	Betatron Phase Advance Measurements Using the Gated Turn-by-turn Monitors at SuperKEKB
	G. Mitsuka; K. Mori; M. Tobiyama
	2019
会议日期	2019
会议地点	Sweden
会议录	Proceedings of the 8th International Beam Instrumentation Conference
语种	英语
内容类型	会议论文
源URL	[http://ir.ihep.ac.cn/handle/311005/288735]
专题	高能物理研究所_学术会议_国际参会_JaCoW高能所参会会议_IBIC
作者单位	KEK, Ibaraki, Japan
推荐引用方式 GB/T 7714	G. Mitsuka,K. Mori,M. Tobiyama. Betatron Phase Advance Measurements Using the Gated Turn-by-turn Monitors at SuperKEKB[C]. 见:. Sweden. 2019.