Beam Instrumentation System for Shanghai Soft X-ray FEL Test Facility

	Beam Instrumentation System for Shanghai Soft X-ray FEL Test Facility
	L.W. Lai; F.Z. Chen; J. Chen; J. Chen; W. Fang; C. Feng; B. Gao; R. Jiang; Y.B. Leng; Y.B. Yan
	2020
会议日期	2020
会议地点	Brazil
会议录	9th International Beam Instrumentation Conference 2020
内容类型	会议论文
源URL	[http://ir.ihep.ac.cn/handle/311005/288482]
专题	高能物理研究所_学术会议_国际参会_JaCoW高能所参会会议_IBIC
作者单位	SSRF, Shanghai, People’s Republic of China
推荐引用方式 GB/T 7714	L.W. Lai,F.Z. Chen,J. Chen,et al. Beam Instrumentation System for Shanghai Soft X-ray FEL Test Facility[C]. 见:. Brazil. 2020.