Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam
Zhu, HL; Davis, J; Li, ZJ
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
2019
卷号455页码:83-89
关键词CORROSION HELIUM YIELDS
ISSN号0168-583X
DOI10.1016/j.nimb.2019.06.026
文献子类期刊论文
英文摘要The effect of crystallographic orientation on radiation damage in Ga-ion irradiated Ni-based polycrystalline alloy processed by a focused ion beam was investigated using advanced analytical transmission electron microscopy. After irradiation, the radiation-induced defects exhibited different morphologies on the surfaces of {0 0 1}, {0 1 2} and {1 1 4} grains of the Ni-based alloy. Moreover, the {0 0 1} grain was found to have thicker remaining material than the {0 1 2} and {1 1 4} grains, indicating that the {0 0 1} grain had a larger sputter yield than the other two grains during irradiation. The physical nature of the crystallographic orientation dependence of the defect morphology and sputter yield was investigated and discussed.
语种英语
内容类型期刊论文
源URL[http://ir.sinap.ac.cn/handle/331007/32019]  
专题上海应用物理研究所_中科院上海应用物理研究所2011-2017年
作者单位1.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China
2.Australian Nucl Sci & Technol Org, Locked Bag 2001, Sydney, NSW 2232, Australia;
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Zhu, HL,Davis, J,Li, ZJ. Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2019,455:83-89.
APA Zhu, HL,Davis, J,&Li, ZJ.(2019).Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,455,83-89.
MLA Zhu, HL,et al."Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 455(2019):83-89.
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