Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam | |
Zhu, HL; Davis, J; Li, ZJ | |
刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS |
2019 | |
卷号 | 455页码:83-89 |
关键词 | CORROSION HELIUM YIELDS |
ISSN号 | 0168-583X |
DOI | 10.1016/j.nimb.2019.06.026 |
文献子类 | 期刊论文 |
英文摘要 | The effect of crystallographic orientation on radiation damage in Ga-ion irradiated Ni-based polycrystalline alloy processed by a focused ion beam was investigated using advanced analytical transmission electron microscopy. After irradiation, the radiation-induced defects exhibited different morphologies on the surfaces of {0 0 1}, {0 1 2} and {1 1 4} grains of the Ni-based alloy. Moreover, the {0 0 1} grain was found to have thicker remaining material than the {0 1 2} and {1 1 4} grains, indicating that the {0 0 1} grain had a larger sputter yield than the other two grains during irradiation. The physical nature of the crystallographic orientation dependence of the defect morphology and sputter yield was investigated and discussed. |
语种 | 英语 |
内容类型 | 期刊论文 |
源URL | [http://ir.sinap.ac.cn/handle/331007/32019] |
专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
作者单位 | 1.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China 2.Australian Nucl Sci & Technol Org, Locked Bag 2001, Sydney, NSW 2232, Australia; |
推荐引用方式 GB/T 7714 | Zhu, HL,Davis, J,Li, ZJ. Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2019,455:83-89. |
APA | Zhu, HL,Davis, J,&Li, ZJ.(2019).Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,455,83-89. |
MLA | Zhu, HL,et al."Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 455(2019):83-89. |
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