A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans
Chen, Xu2; Guo, Tengfei1; Hou, Yubin1; Zhang, Jing1; Meng, Wenjie1; Lu, Qingyou1,3
刊名SCANNING
2017
卷号期号:页码:7
ISSN号0161-0457
DOI10.1155/2017/1020476
英文摘要

A new scan-head structure for the scanning tunneling microscope (STM) is proposed, featuring high scan precision and rigidity. The core structure consists of a piezoelectric tube scanner of quadrant type (for XY scans) coaxially housed in a piezoelectric tube with single inner and outer electrodes (for Z scan). They are fixed at one end (called common end). A hollow tantalum shaft is coaxially housed in the XY-scan tube and they are mutually fixed at both ends. When the XY scanner scans, its free end will bring the shaft to scan and the tip which is coaxially inserted in the shaft at the common end will scan a smaller area if the tip protrudes short enough from the common end. The decoupled XY and Z scans are desired for less image distortion and the mechanically reduced scan range has the superiority of reducing the impact of the background electronic noise on the scanner and enhancing the tip positioning precision. High quality atomic resolution images are also shown.

资助项目Chinese Academy of Sciences Scientific Research Equipment ; Anhui Provincial Natural Science Foundation ; Major/Innovative Program of Development Foundation of Hefei Center for Physical Science and Technology ; Project of the Chinese National High Magnetic Field Facilities ; Scientific Research Grant of Hefei Science Center of CAS ; National Natural Science Foundation of China[YZ201628] ; National Natural Science Foundation of China[1608085MB36] ; National Natural Science Foundation of China[U1232210] ; National Natural Science Foundation of China[U1632160] ; National Natural Science Foundation of China[21505139] ; National Natural Science Foundation of China[11374278] ; National Natural Science Foundation of China[11704384] ; National Natural Science Foundation of China[YZJJ20162]
WOS关键词STM
WOS研究方向Instruments & Instrumentation ; Microscopy
语种英语
出版者WILEY-HINDAWI
WOS记录号WOS:000415738300001
内容类型期刊论文
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/34836]  
专题合肥物质科学研究院_中科院强磁场科学中心
通讯作者Meng, Wenjie; Lu, Qingyou
作者单位1.Chinese Acad Sci, High Field Magnet Lab, Anhui Prov Key Lab Condensed Matter Phys Extreme, Hefei 230031, Anhui, Peoples R China
2.Tongji Univ, Sinogerman Engn Coll, Shanghai 201804, Peoples R China
3.Univ Sci & Technol China, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Anhui, Peoples R China
推荐引用方式
GB/T 7714
Chen, Xu,Guo, Tengfei,Hou, Yubin,et al. A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans[J]. SCANNING,2017,无(无):7.
APA Chen, Xu,Guo, Tengfei,Hou, Yubin,Zhang, Jing,Meng, Wenjie,&Lu, Qingyou.(2017).A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans.SCANNING,无(无),7.
MLA Chen, Xu,et al."A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans".SCANNING 无.无(2017):7.
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