A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring
Liu, Tongshun1; Zhu, Kunpeng2
刊名IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
2021-04-01
卷号17
关键词Condition monitoring degradation process remaining useful life (RUL) switching hidden semi-Markov model (SHSMM) tool wear monitoring (TWM)
ISSN号1551-3203
DOI10.1109/TII.2020.3004445
通讯作者Zhu, Kunpeng(zhukp@iamt.ac.cn)
英文摘要Hidden semi-Markov model (HSMM) has been widely used in equipment condition monitoring. However, the HSMM is usually modeled in fixed working mode. It is incompetent to monitor the condition when the working mode is varying in the equipment's lifetime. In this article, taking time-varying working mode into account, we propose a novel switching HSMM (SHSMM) to represent the equipment's degradation process. The reciprocal of duration is modeled and utilized to quantize the influence of working mode on the degradation process. Compared to traditional HSMM and time-varying HMM, the proposed SHSMM has a more generalized form and a more powerful ability to describe the degradation process with time-varying working mode. The proposed SHSMM is then applied to tool wear monitoring with time-varying cutting mode. Experimental results show that, via the proposed SHSMM, the monitoring confidence increases and the estimation of remaining useful life has a great improvement.
资助项目Natural Science Foundation of the Jiangsu Higher Education Institutions of China[19KJB460007] ; National Natural Science Foundation of China[51475443] ; National Natural Science Foundation of China[TII-20-1566]
WOS研究方向Automation & Control Systems ; Computer Science ; Engineering
语种英语
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号WOS:000607814600031
资助机构Natural Science Foundation of the Jiangsu Higher Education Institutions of China ; National Natural Science Foundation of China
内容类型期刊论文
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/119778]  
专题中国科学院合肥物质科学研究院
通讯作者Zhu, Kunpeng
作者单位1.Soochow Univ, Sch Mech & Elect Engn, Suzhou 215137, Peoples R China
2.Chinese Acad Sci, Hefei Inst Phys Sci, Inst Adv Mfg Technol, Changzhou 213164, Jiangsu, Peoples R China
推荐引用方式
GB/T 7714
Liu, Tongshun,Zhu, Kunpeng. A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring[J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,2021,17.
APA Liu, Tongshun,&Zhu, Kunpeng.(2021).A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring.IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,17.
MLA Liu, Tongshun,et al."A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring".IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS 17(2021).
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