One-step ion beam irradiation manufacture of 3D micro/nanopatterned structures in SiC with tunable work functions
Zhou Yuying; Li Shimin; Wang Ying; Huang Qing; Zhang Wei; Yao Yao; Hao Jiaming; sun yan; Tang Ming; Li Bin
刊名CARBON
2019
卷号148期号:页码:387-393
关键词FIELD-EMISSION LITHOGRAPHY FABRICATION TEMPLATE GRAPHENE DEFECTS TIP
DOI10.1016/j.carbon.2019.04.011
英文摘要The fabrication and design of high-quality three-dimensional (3D) micro/nanostructures are of great importance for the development of new technology. Herein, we report a one-step technique to controllably manufacture 3D micro/nanopatterned structures with tunable work functions in silicon carbide (SiC). The multiscale micro/nanopatterned structures were produced directly by ion beam irradiation-induced swelling with the assistance of masks. The minimum feature size was similar to 52 nm and the swelling height could be controlled flexibly from similar to 1 to similar to 250 nm. The change of work function of the 3D SiC micro/nanostructures could be tuned in the range between 0 and similar to 126.6 meV. Distinct rectifying junction behavior was demonstrated between the irradiated and unirradiated zones. The Young's modulus and hardness values of the irradiated zones stabilized at similar to 298.1 GPa and similar to 24.9 GPa, respectively. (C) 2019 Elsevier Ltd. All rights reserved.
WOS记录号WOS:000468421900042
内容类型期刊论文
源URL[http://202.127.2.71:8080/handle/181331/12393]  
专题上海技术物理研究所_上海技物所
推荐引用方式
GB/T 7714
Zhou Yuying,Li Shimin,Wang Ying,et al. One-step ion beam irradiation manufacture of 3D micro/nanopatterned structures in SiC with tunable work functions[J]. CARBON,2019,148(无):387-393.
APA Zhou Yuying.,Li Shimin.,Wang Ying.,Huang Qing.,Zhang Wei.,...&Yan Long.(2019).One-step ion beam irradiation manufacture of 3D micro/nanopatterned structures in SiC with tunable work functions.CARBON,148(无),387-393.
MLA Zhou Yuying,et al."One-step ion beam irradiation manufacture of 3D micro/nanopatterned structures in SiC with tunable work functions".CARBON 148.无(2019):387-393.
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