| Optical device for characteristic inspection of photosemiconductor element | |
| TADA TOSHIO | |
| 1988-02-04 | |
| 著作权人 | NEC CORP |
| 专利号 | JP1988026545A |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Optical device for characteristic inspection of photosemiconductor element |
| 英文摘要 | PURPOSE:To eliminate the need to adjust the optical axis to a laser diode and to improve the efficiency of inspecting operation and the accuracy of measurement by combining and uniting a large-diameter handle fiber, a long-focus lens, and a short-focus lens. CONSTITUTION:The laser diode 1 as an object of inspection is fitted nearby the incidence port 2a of the large-diameter handle fiber 2 and light is emitted by an external power source, made incident on the incidence part 2a, and projected from a projection port 2b on the other end surface. A collimator lens 3 with long focus (f1) is provided behind the handle fiber 2 to make the incident light parallel. The spherical lens 4 with extremely short focus (f2) is provided behind the lens 3 and the incident light is made incident on a small-diameter photodetector 5 through this lens and converted here into an electric signal, which is sent to a characteristic inspecting device. Those handle fiber 2, lens 3, lens 4, and photodetector 5 are coupled in one body while their optical axes are aligned with one another. |
| 公开日期 | 1988-02-04 |
| 申请日期 | 1986-07-18 |
| 状态 | 失效 |
| 内容类型 | 专利 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/63035]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | NEC CORP |
| 推荐引用方式 GB/T 7714 | TADA TOSHIO. Optical device for characteristic inspection of photosemiconductor element. JP1988026545A. 1988-02-04. |
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