Inspection of semiconductor laser element | |
NAKAMURA TOMOJI | |
1989-09-08 | |
著作权人 | FUJITSU LTD |
专利号 | JP1989225385A |
国家 | 日本 |
文献子类 | 发明申请 |
其他题名 | Inspection of semiconductor laser element |
英文摘要 | PURPOSE:To simplify a device and inspect it easily at a low cost in a short while, by discriminating the deterioration of oscillation characteristics of a semiconductor laser element on the basis of Roman scattering light in a laser beam which is emitted by using the semiconductor laser element as an excitation source. CONSTITUTION:Using a semiconductor laser element 4a itself to be inspected as an excitation light source, this device is operated by a power source 9. Spectral diffraction is observed through a condenser 3 when Roman scattering light in an emitting laser beam passes through a spectroscope 6 and, after that, it is detected by a detector 8 to take measurements. When its operation is normal, the half-width of it is distinctive; whilst when its operation is abnormal, its half-width extends on the low wave side having a high energy. Thus, the deterioration of an active layer is inspected easily. |
公开日期 | 1989-09-08 |
申请日期 | 1988-03-04 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/62618] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | FUJITSU LTD |
推荐引用方式 GB/T 7714 | NAKAMURA TOMOJI. Inspection of semiconductor laser element. JP1989225385A. 1989-09-08. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论