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	Inspection of semiconductor laser element
	NAKAMURA TOMOJI
	1989-09-08
著作权人	FUJITSU LTD
专利号	JP1989225385A
国家	日本
文献子类	发明申请
其他题名	Inspection of semiconductor laser element
英文摘要	PURPOSE:To simplify a device and inspect it easily at a low cost in a short while, by discriminating the deterioration of oscillation characteristics of a semiconductor laser element on the basis of Roman scattering light in a laser beam which is emitted by using the semiconductor laser element as an excitation source. CONSTITUTION:Using a semiconductor laser element 4a itself to be inspected as an excitation light source, this device is operated by a power source 9. Spectral diffraction is observed through a condenser 3 when Roman scattering light in an emitting laser beam passes through a spectroscope 6 and, after that, it is detected by a detector 8 to take measurements. When its operation is normal, the half-width of it is distinctive; whilst when its operation is abnormal, its half-width extends on the low wave side having a high energy. Thus, the deterioration of an active layer is inspected easily.
公开日期	1989-09-08
申请日期	1988-03-04
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62618]
专题	半导体激光器专利数据库
作者单位	FUJITSU LTD
推荐引用方式 GB/T 7714	NAKAMURA TOMOJI. Inspection of semiconductor laser element. JP1989225385A. 1989-09-08.

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