Measuring device for semiconductor laser element | |
TADA TOSHIO | |
1986-03-22 | |
著作权人 | NEC CORP |
专利号 | JP1986056482A |
国家 | 日本 |
文献子类 | 发明申请 |
其他题名 | Measuring device for semiconductor laser element |
英文摘要 | PURPOSE:To improve the measuring accuracy and the measuring efficiency by a method wherein light received by a parabolic mirror is converted into electric signal by focus ing to one of two photo receiving sensors, and is then chaged over according to the wavelength characteristics of the photo receiving sensors: this change-over is carried out by rotating the parabolic mirror at a fixed angle. CONSTITUTION:An LD element 1 is ajusted to the position of measurement and supplied with operating current to release a prescribed output from the drive power source. The laser beam emitted out of the LD element 1 enters an incidence slit 3 reduced to several 10mum and passes through the light path of a monochromator 4, and only the spectrum setby the monochromator 4 appears in an emission slit 5. This optical spectrum is reflected on a plane mirror 12 and guided to a parabolic mirror 13, and thelight is reduced the parabolic mirror 13 and then comes into a photosensor 9 or 8. The amount of incident light is converted into electric signal by the photosensor 9 or 8, passes througyh the mirror 13 and an interlocking switch 14, and is connected to the vertical axis of a display oscilloscope 1 On the other hand, synchronized signals are connected to the horizontal axis of the display oscilloscope 11 by means of the monochromator 4, and draw the wavelength characteristics of the LE element on the oscilloscope. |
公开日期 | 1986-03-22 |
申请日期 | 1984-08-28 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/62595] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | NEC CORP |
推荐引用方式 GB/T 7714 | TADA TOSHIO. Measuring device for semiconductor laser element. JP1986056482A. 1986-03-22. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论