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	Measuring device for semiconductor laser element
	TADA TOSHIO
	1986-03-22
著作权人	NEC CORP
专利号	JP1986056482A
国家	日本
文献子类	发明申请
其他题名	Measuring device for semiconductor laser element
英文摘要	PURPOSE:To improve the measuring accuracy and the measuring efficiency by a method wherein light received by a parabolic mirror is converted into electric signal by focus ing to one of two photo receiving sensors, and is then chaged over according to the wavelength characteristics of the photo receiving sensors: this change-over is carried out by rotating the parabolic mirror at a fixed angle. CONSTITUTION:An LD element 1 is ajusted to the position of measurement and supplied with operating current to release a prescribed output from the drive power source. The laser beam emitted out of the LD element 1 enters an incidence slit 3 reduced to several 10mum and passes through the light path of a monochromator 4, and only the spectrum setby the monochromator 4 appears in an emission slit 5. This optical spectrum is reflected on a plane mirror 12 and guided to a parabolic mirror 13, and thelight is reduced the parabolic mirror 13 and then comes into a photosensor 9 or 8. The amount of incident light is converted into electric signal by the photosensor 9 or 8, passes througyh the mirror 13 and an interlocking switch 14, and is connected to the vertical axis of a display oscilloscope 1 On the other hand, synchronized signals are connected to the horizontal axis of the display oscilloscope 11 by means of the monochromator 4, and draw the wavelength characteristics of the LE element on the oscilloscope.
公开日期	1986-03-22
申请日期	1984-08-28
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62595]
专题	半导体激光器专利数据库
作者单位	NEC CORP
推荐引用方式 GB/T 7714	TADA TOSHIO. Measuring device for semiconductor laser element. JP1986056482A. 1986-03-22.

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