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	Measuring apparatus of semiconductor laser element
	TADA TOSHIO
	1985-10-21
著作权人	NIPPON DENKI KK
专利号	JP1985208885A
国家	日本
文献子类	发明申请
其他题名	Measuring apparatus of semiconductor laser element
英文摘要	PURPOSE:To improve measuring accuracy and to expedite measuring speed, by electrically performing all measurements, in a measuring apparatus for the far- field pattern characteristics of a semiconductor laser element. CONSTITUTION:The light emitting intensity of a semiconductor laser element 10, which is driven by a pulse driver 12, is converted into an electric signal by a two-dimensional image sensor 15. The signal is converted into a digital signal by an A/D converter 18. The digital signal for one picture from the two-dimensional image sensor 15 is stored in a memory part 19. A controller/data processing part 20 controls the driver 12 based on the output of the LD element 10 from the memory part 19 so that the output of the LD element 10 becomes a specified value. The far field pattern data at the time of the specified output is stored in the memory part 19. Thereafter, the controller/data processing part 20 receives the light output signals in the horizontal and vertical directions, computes the half-value angle of the light output and judges the quality of the LD element upon comparison with the preliminarily inputted specified value.
公开日期	1985-10-21
申请日期	1984-04-02
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62593]
专题	半导体激光器专利数据库
作者单位	NIPPON DENKI KK
推荐引用方式 GB/T 7714	TADA TOSHIO. Measuring apparatus of semiconductor laser element. JP1985208885A. 1985-10-21.

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