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	Optical displacement-detecting mechanism and probe microscope using the same
	IYOKI, MASATO; YAMAMOTO, HIROYOSHI; WATANABE, KAZUTOSHI
	2008-02-28
著作权人	HITACHI HIGH-TECH SCIENCE CORPORATION
专利号	US20080049223A1
国家	美国
文献子类	发明申请
其他题名	Optical displacement-detecting mechanism and probe microscope using the same
英文摘要	The optical displacement-detecting mechanism has: a light source for irradiating a target for measurement with light; a light source-driving circuit for driving the light source; an optical detector made from a semiconductor for receiving light after the irradiation of the target for measurement by the light source and converting the light into an electric signal thereby to detect an intensity of light; and an amplifier including a current-voltage conversion circuit for performing current-to-voltage conversion on a detection signal of the optical detector with a predetermined amplification factor. In the optical displacement-detecting mechanism, a light source having a spectrum half width of 10 nm or larger is used, whereby the light source can be driven with an output power of 2 mW or larger without generating mode hop noise and optical feedback noise.
公开日期	2008-02-28
申请日期	2007-08-17
状态	授权
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62517]
专题	半导体激光器专利数据库
作者单位	HITACHI HIGH-TECH SCIENCE CORPORATION
推荐引用方式 GB/T 7714	IYOKI, MASATO,YAMAMOTO, HIROYOSHI,WATANABE, KAZUTOSHI. Optical displacement-detecting mechanism and probe microscope using the same. US20080049223A1. 2008-02-28.

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