Infrared projector and infrared observation system
TAKAHASHI, KOJI; KAWANISHI, HIDENORI
2018-03-22
著作权人SHARP KABUSHIKI KAISHA
专利号US20180080816A1
国家美国
文献子类发明申请
其他题名Infrared projector and infrared observation system
英文摘要An infrared projector and an infrared observation system by which unevenness of wavelengths in a projection pattern is reduced are provided. An infrared projector (100) is provided with infrared semiconductor laser elements (11a to 11d) that emit near-infrared laser light beams (L1a, L1b, L1c, and L1d), a scattering member (51) that receives and scatters the near-infrared laser light beams, and a projecting member (61) that projects the near-infrared laser light beams scattered by the scattering member.
公开日期2018-03-22
申请日期2016-03-16
状态授权
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/59075]  
专题半导体激光器专利数据库
作者单位SHARP KABUSHIKI KAISHA
推荐引用方式
GB/T 7714
TAKAHASHI, KOJI,KAWANISHI, HIDENORI. Infrared projector and infrared observation system. US20180080816A1. 2018-03-22.
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