Infrared projector and infrared observation system | |
TAKAHASHI, KOJI; KAWANISHI, HIDENORI | |
2018-03-22 | |
著作权人 | SHARP KABUSHIKI KAISHA |
专利号 | US20180080816A1 |
国家 | 美国 |
文献子类 | 发明申请 |
其他题名 | Infrared projector and infrared observation system |
英文摘要 | An infrared projector and an infrared observation system by which unevenness of wavelengths in a projection pattern is reduced are provided. An infrared projector (100) is provided with infrared semiconductor laser elements (11a to 11d) that emit near-infrared laser light beams (L1a, L1b, L1c, and L1d), a scattering member (51) that receives and scatters the near-infrared laser light beams, and a projecting member (61) that projects the near-infrared laser light beams scattered by the scattering member. |
公开日期 | 2018-03-22 |
申请日期 | 2016-03-16 |
状态 | 授权 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/59075] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | SHARP KABUSHIKI KAISHA |
推荐引用方式 GB/T 7714 | TAKAHASHI, KOJI,KAWANISHI, HIDENORI. Infrared projector and infrared observation system. US20180080816A1. 2018-03-22. |
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