QQ客服 官方微博 反馈留言

	Characteristic measuring apparatus for semiconductor laser
	SEKINO TOSHIAKI
	1992-09-24
著作权人	日本電気株式会社
专利号	JP1992268466A
国家	日本
文献子类	发明申请
其他题名	Characteristic measuring apparatus for semiconductor laser
英文摘要	PURPOSE:To achieve a higher measuring accuracy of a thermal resistance of a semiconductor laser. CONSTITUTION:This apparatus is provided with a pulse generator 3 rising time of pulse thereof is made shorter than a thermal time constant of a chip of a semiconductor laser 1 to be measured while a pulse width thereof is larger sufficiently than a case thermal time constant of the semiconductor laser, a converter 5 to convert an optical signal from the semiconductor laser into an electrical signal, on observer 9 to observe an output of the converter and a temperature controller 4 to change the temperature of the semiconductor laser optionally. A current having magnitude larger than an oscillation threshold is fed to the semiconductor laser to measure a heat resistance while increasing the temperature rise.
公开日期	1992-09-24
申请日期	1991-02-22
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/50673]
专题	半导体激光器专利数据库
作者单位	日本電気株式会社
推荐引用方式 GB/T 7714	SEKINO TOSHIAKI. Characteristic measuring apparatus for semiconductor laser. JP1992268466A. 1992-09-24.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。