QQ客服 官方微博 反馈留言

	Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source
	KITAOKA, YASUO; YOKOYAMA, TOSHIFUMI; YAMAMOTO, KAZUHISA
	2006-07-25
著作权人	MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
专利号	US7082146
国家	美国
文献子类	授权发明
其他题名	Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source
英文摘要	A method for easily and quickly evaluating the wavelength variability properties of a wavelength-variable semiconductor laser is provided. An inspection device includes a power source for supplying current to a wavelength-variable DBR semiconductor laser having an active region, a phase control region, and a DBR region, a photo-detector for detecting an output intensity of laser beam emitted from the wavelength-variable DBR semiconductor laser, and a transmission type wavelength-selection element that can be inserted into a light path from the wavelength-variable DBR semiconductor laser to the photo-detector. In a state where the transmission type wavelength-selection element is inserted into the light path from the wavelength-variable DBR semiconductor laser to the photo-detector, at least one of a phase current that is supplied to the phase control region and a DBR current that is supplied to the DBR region is changed with respect to a predetermined active current that is supplied to the active region, and the output intensity of the laser beam after the laser beam has passed through the transmission type wavelength-selection element is detected by the photo-detector.
公开日期	2006-07-25
申请日期	2005-08-04
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/44625]
专题	半导体激光器专利数据库
作者单位	MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
推荐引用方式 GB/T 7714	KITAOKA, YASUO,YOKOYAMA, TOSHIFUMI,YAMAMOTO, KAZUHISA. Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source. US7082146. 2006-07-25.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。