| Affect of heat treatment on structure and electrical properties of zinc oxide films | |
| Ma Jin; Ji Feng; Li Shuying; Ma Honglei | |
| 刊名 | Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
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| 1998 | |
| 卷号 | 19期号:6页码:472-476 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6798510 |
| 专题 | 山东大学 |
| 作者单位 | 1.Shandong Univ, Jinan, China 2.Shandong Univ, Jinan, China 3.Shandong Univ, Jinan, China 4.Shandong Univ, Jin |
| 推荐引用方式 GB/T 7714 | Ma Jin,Ji Feng,Li Shuying,et al. Affect of heat treatment on structure and electrical properties of zinc oxide films[J]. Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors,1998,19(6):472-476. |
| APA | Ma Jin,Ji Feng,Li Shuying,&Ma Honglei.(1998).Affect of heat treatment on structure and electrical properties of zinc oxide films.Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors,19(6),472-476. |
| MLA | Ma Jin,et al."Affect of heat treatment on structure and electrical properties of zinc oxide films".Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors 19.6(1998):472-476. |
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