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	Thickness dependence of structural, optical and electrical properties of ZnO : Al films prepared on flexible substrates
	Hao XT.; Zhang DH.; Yang TL.; Ma HL.; Yang YG.; Cheng CF.; Huang J.; Ma J.
刊名	Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials
	2001
期号	1页码:137-142
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6782699
专题	山东大学
作者单位	Shandong Univ, Sch Phys & Microelect, Jinan 250100, Shandong, Peoples R China.
推荐引用方式 GB/T 7714	Hao XT.,Zhang DH.,Yang TL.,et al. Thickness dependence of structural, optical and electrical properties of ZnO : Al films prepared on flexible substrates[J]. Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2001(1):137-142.
APA	Hao XT..,Zhang DH..,Yang TL..,Ma HL..,Yang YG..,...&Ma J..(2001).Thickness dependence of structural, optical and electrical properties of ZnO : Al films prepared on flexible substrates.Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials(1),137-142.
MLA	Hao XT.,et al."Thickness dependence of structural, optical and electrical properties of ZnO : Al films prepared on flexible substrates".Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials .1(2001):137-142.

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