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As SOCs grow, instruments move on-chip.
Wilson,Ron
刊名Test and Measurement World
2008
卷号Vol.28 No.3页码:23
关键词INTEGRATED circuits INFORMATION technology SYSTEM design ELECTRONIC circuit design RADIO frequency FREQUENCIES of oscillating systems
ISSN号0744-1657
URL标识查看原文
公开日期[db:dc_date_available]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/6759573
专题上海电子信息职业技术学院
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Wilson,Ron. As SOCs grow, instruments move on-chip.[J]. Test and Measurement World,2008,Vol.28 No.3:23.
APA Wilson,Ron.(2008).As SOCs grow, instruments move on-chip..Test and Measurement World,Vol.28 No.3,23.
MLA Wilson,Ron."As SOCs grow, instruments move on-chip.".Test and Measurement World Vol.28 No.3(2008):23.
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