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	Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits.
	Chun-LungHsucch@mail.ndhu.edu.tw; Mean-HomHo; Chih-FengLin
刊名	IEEE Transactions on Instrumentation and Measurement
	2009
卷号	Vol.58 No.7页码:2196-2208
关键词	DETECTORS METAL oxide semiconductors, Complementary DIGITAL electronics INTEGRATED circuits INFORMATION technology SIMULATION methods
ISSN号	0018-9456
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6750360
专题	上海电子信息职业技术学院
作者单位	1 Department of Electrical Engineering, National Dong Hwa University, Hualien 97401, Taiwan 2 Winbond Electronics Corporation, Taichung 428, Taiwan
推荐引用方式 GB/T 7714	Chun-LungHsucch@mail.ndhu.edu.tw,Mean-HomHo,Chih-FengLin. Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits.[J]. IEEE Transactions on Instrumentation and Measurement,2009,Vol.58 No.7:2196-2208.
APA	Chun-LungHsucch@mail.ndhu.edu.tw,Mean-HomHo,&Chih-FengLin.(2009).Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits..IEEE Transactions on Instrumentation and Measurement,Vol.58 No.7,2196-2208.
MLA	Chun-LungHsucch@mail.ndhu.edu.tw,et al."Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits.".IEEE Transactions on Instrumentation and Measurement Vol.58 No.7(2009):2196-2208.

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