Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits. | |
Chun-LungHsucch@mail.ndhu.edu.tw; Mean-HomHo; Chih-FengLin | |
刊名 | IEEE Transactions on Instrumentation and Measurement
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2009 | |
卷号 | Vol.58 No.7页码:2196-2208 |
关键词 | DETECTORS METAL oxide semiconductors, Complementary DIGITAL electronics INTEGRATED circuits INFORMATION technology SIMULATION methods |
ISSN号 | 0018-9456 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6750360 |
专题 | 上海电子信息职业技术学院 |
作者单位 | 1 Department of Electrical Engineering, National Dong Hwa University, Hualien 97401, Taiwan 2 Winbond Electronics Corporation, Taichung 428, Taiwan |
推荐引用方式 GB/T 7714 | Chun-LungHsucch@mail.ndhu.edu.tw,Mean-HomHo,Chih-FengLin. Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits.[J]. IEEE Transactions on Instrumentation and Measurement,2009,Vol.58 No.7:2196-2208. |
APA | Chun-LungHsucch@mail.ndhu.edu.tw,Mean-HomHo,&Chih-FengLin.(2009).Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits..IEEE Transactions on Instrumentation and Measurement,Vol.58 No.7,2196-2208. |
MLA | Chun-LungHsucch@mail.ndhu.edu.tw,et al."Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits.".IEEE Transactions on Instrumentation and Measurement Vol.58 No.7(2009):2196-2208. |
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