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	Nonlinear images of gain defects
	Hu, Yonghua; Wu, Haibo; Zheng, Qiuyun; Huang, Jie; Xu, Jianbo
刊名	Proceedings of the SPIE - The International Society for Optical Engineering
	2010
卷号	Vol.7843页码:78431G
ISSN号	0277-786X
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6667687
专题	湖南大学
作者单位	School of Computer Science and Engineering, Hunan University of Science and Technology, Xiangtan, 411201, China
推荐引用方式 GB/T 7714	Hu, Yonghua,Wu, Haibo,Zheng, Qiuyun,et al. Nonlinear images of gain defects[J]. Proceedings of the SPIE - The International Society for Optical Engineering,2010,Vol.7843:78431G.
APA	Hu, Yonghua,Wu, Haibo,Zheng, Qiuyun,Huang, Jie,&Xu, Jianbo.(2010).Nonlinear images of gain defects.Proceedings of the SPIE - The International Society for Optical Engineering,Vol.7843,78431G.
MLA	Hu, Yonghua,et al."Nonlinear images of gain defects".Proceedings of the SPIE - The International Society for Optical Engineering Vol.7843(2010):78431G.

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