| Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials | |
| Tian, WY; Chen, YH | |
| 刊名 | SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES
 |
| 2002 | |
| 卷号 | 45期号:1页码:10-18 |
| 关键词 | metal/piezoelectric ceramic bimaterials subinterface crack J-integral analysis |
| ISSN号 | 1006-9321 |
| DOI | 10.1360/02ye9002 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; SCOPUS ; EI |
| WOS记录号 | WOS:000175271700002 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6612721 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Tian, WY,Chen, YH. Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials[J]. SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,2002,45(1):10-18. |
| APA | Tian, WY,&Chen, YH.(2002).Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials.SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,45(1),10-18. |
| MLA | Tian, WY,et al."Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials".SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES 45.1(2002):10-18. |
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