Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials | |
Tian, WY; Chen, YH | |
刊名 | SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES
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2002 | |
卷号 | 45期号:1页码:10-18 |
关键词 | metal/piezoelectric ceramic bimaterials subinterface crack J-integral analysis |
ISSN号 | 1006-9321 |
DOI | 10.1360/02ye9002 |
URL标识 | 查看原文 |
收录类别 | SCIE ; SCOPUS ; EI |
WOS记录号 | WOS:000175271700002 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6612721 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Tian, WY,Chen, YH. Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials[J]. SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,2002,45(1):10-18. |
APA | Tian, WY,&Chen, YH.(2002).Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials.SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,45(1),10-18. |
MLA | Tian, WY,et al."Interaction between subinterface cracks and interface in metal/piezoelectric ceramic bimaterials".SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES 45.1(2002):10-18. |
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