Temperature-humidity oriented reliability prediction for electronic equipments | |
Ding, Xiaoxue; Sun, Yufeng; Hu, Weiwei; Qi, Bangyan | |
2011 | |
会议名称 | 2011 9th International Conference on Reliability, Maintainability and Safety: Safety First, Reliability Primary, ICRMS'2011 |
会议日期 | 2011-06-12 |
会议地点 | Guiyang, China |
页码 | 149-153 |
收录类别 | EI |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6582915 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Ding, Xiaoxue,Sun, Yufeng,Hu, Weiwei,et al. Temperature-humidity oriented reliability prediction for electronic equipments[C]. 见:2011 9th International Conference on Reliability, Maintainability and Safety: Safety First, Reliability Primary, ICRMS'2011. Guiyang, China. 2011-06-12. |
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