| The design and simulation study of the electrothermal excitation resonant beam based on slit-structure stress concentration effect | |
| Shi, HuiChao; Fan, Shangchun; Xing, Weiwei; Sun, Jinhao | |
| 2012 | |
| 会议名称 | 8th IEEE International Symposium on Instrumentation and Control Technology, ISICT 2012 |
| 会议日期 | 2012-07-11 |
| 会议地点 | London, United kingdom |
| 页码 | 205-209 |
| 收录类别 | EI |
| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6572577 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Shi, HuiChao,Fan, Shangchun,Xing, Weiwei,et al. The design and simulation study of the electrothermal excitation resonant beam based on slit-structure stress concentration effect[C]. 见:8th IEEE International Symposium on Instrumentation and Control Technology, ISICT 2012. London, United kingdom. 2012-07-11. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论