The design and simulation study of the electrothermal excitation resonant beam based on slit-structure stress concentration effect | |
Shi, HuiChao; Fan, Shangchun; Xing, Weiwei; Sun, Jinhao | |
2012 | |
会议名称 | 8th IEEE International Symposium on Instrumentation and Control Technology, ISICT 2012 |
会议日期 | 2012-07-11 |
会议地点 | London, United kingdom |
页码 | 205-209 |
收录类别 | EI |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6572577 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Shi, HuiChao,Fan, Shangchun,Xing, Weiwei,et al. The design and simulation study of the electrothermal excitation resonant beam based on slit-structure stress concentration effect[C]. 见:8th IEEE International Symposium on Instrumentation and Control Technology, ISICT 2012. London, United kingdom. 2012-07-11. |
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