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	A complex programmable logic device-based high-precision electrical capacitance tomography system
	Zhou, Haili; Xu, Lijun; Cao, Zhang; Liu, XiaoLei; Liu, Shi
刊名	MEASUREMENT SCIENCE AND TECHNOLOGY
	2013
卷号	24
关键词	electrical capacitance tomography capacitance measurement double-T-switches CPLD digital demodulation
ISSN号	0957-0233
DOI	10.1088/0957-0233/24/7/074006
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000320449100008
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6569425
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Zhou, Haili,Xu, Lijun,Cao, Zhang,et al. A complex programmable logic device-based high-precision electrical capacitance tomography system[J]. MEASUREMENT SCIENCE AND TECHNOLOGY,2013,24.
APA	Zhou, Haili,Xu, Lijun,Cao, Zhang,Liu, XiaoLei,&Liu, Shi.(2013).A complex programmable logic device-based high-precision electrical capacitance tomography system.MEASUREMENT SCIENCE AND TECHNOLOGY,24.
MLA	Zhou, Haili,et al."A complex programmable logic device-based high-precision electrical capacitance tomography system".MEASUREMENT SCIENCE AND TECHNOLOGY 24(2013).

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