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An Improvement Method for Efficiency and Stability of Circuit Fault Simulation
Zhao, Guangyan; Sun, Yufeng; Hu, Weiwei; Zhao, Gang
2013
会议名称PROCEEDINGS OF THE 2013 INTERNATIONAL CONFERENCE ON ADVANCED ICT AND EDUCATION
会议日期2013-01-01
关键词circuit fault simulation functional reliability simulation reliability
卷号33
页码640-645
收录类别CPCI-S
URL标识查看原文
WOS记录号WOS:000327670900129
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/6563692
专题北京航空航天大学
推荐引用方式
GB/T 7714
Zhao, Guangyan,Sun, Yufeng,Hu, Weiwei,et al. An Improvement Method for Efficiency and Stability of Circuit Fault Simulation[C]. 见:PROCEEDINGS OF THE 2013 INTERNATIONAL CONFERENCE ON ADVANCED ICT AND EDUCATION. 2013-01-01.
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