| The Accelerated Degradation Test and Evaluation Methods for Printed Circuit Board Coatings | |
| Zhu, Run; Wang, Xiaohui; Ren, Xiaoming | |
| 2014 | |
| 会议名称 | PROCEEDINGS OF 2014 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-2014 HUNAN) |
| 会议日期 | 2014-01-01 |
| 关键词 | salt fog test step-stress accelerated degradation test insulation resistance |
| 页码 | 474-477 |
| 收录类别 | CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000412752200098 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6557218 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Zhu, Run,Wang, Xiaohui,Ren, Xiaoming. The Accelerated Degradation Test and Evaluation Methods for Printed Circuit Board Coatings[C]. 见:PROCEEDINGS OF 2014 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-2014 HUNAN). 2014-01-01. |
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