The Accelerated Degradation Test and Evaluation Methods for Printed Circuit Board Coatings | |
Zhu, Run; Wang, Xiaohui; Ren, Xiaoming | |
2014 | |
会议名称 | PROCEEDINGS OF 2014 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-2014 HUNAN) |
会议日期 | 2014-01-01 |
关键词 | salt fog test step-stress accelerated degradation test insulation resistance |
页码 | 474-477 |
收录类别 | CPCI-S |
URL标识 | 查看原文 |
WOS记录号 | WOS:000412752200098 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6557218 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Zhu, Run,Wang, Xiaohui,Ren, Xiaoming. The Accelerated Degradation Test and Evaluation Methods for Printed Circuit Board Coatings[C]. 见:PROCEEDINGS OF 2014 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-2014 HUNAN). 2014-01-01. |
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