| Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses | |
| Wang, Y.; Zhang, Y.; Deng, E. Y.; Klein, J. O.; Naviner, L. A. B.; Zhao, W. S. | |
| 刊名 | MICROELECTRONICS RELIABILITY
 |
| 2014 | |
| 卷号 | 54页码:1774-1778 |
| 关键词 | PMAMTJ Stochastic Resistance variation Temperature evaluation Dielectric breakdown |
| ISSN号 | 0026-2714 |
| DOI | 10.1016/j.microrel.2014.07.019 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE |
| WOS记录号 | WOS:000345489900028 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6552072 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Wang, Y.,Zhang, Y.,Deng, E. Y.,et al. Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses[J]. MICROELECTRONICS RELIABILITY,2014,54:1774-1778. |
| APA | Wang, Y.,Zhang, Y.,Deng, E. Y.,Klein, J. O.,Naviner, L. A. B.,&Zhao, W. S..(2014).Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses.MICROELECTRONICS RELIABILITY,54,1774-1778. |
| MLA | Wang, Y.,et al."Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses".MICROELECTRONICS RELIABILITY 54(2014):1774-1778. |
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