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Comparative Analysis between CTR and LowFrequency Noiseto Characterize the Optocoupler Reliability
Gao Cheng; Wang Yufei; Huang Jiaoying; Sun Yue
2014
会议名称Prognostics and System Health Management Conference (PHM- Hunan)
会议地点Lab Sci & Technol Integrated Logist Support, Zhangjiajie, PEOPLES R CHINA
关键词optocoupler low-frefquency noise accelerated life test degradation reliability
页码36-40
收录类别CPCI-S
URL标识查看原文
WOS记录号WOS:000412752200008
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/6548966
专题北京航空航天大学
推荐引用方式
GB/T 7714
Gao Cheng,Wang Yufei,Huang Jiaoying,et al. Comparative Analysis between CTR and LowFrequency Noiseto Characterize the Optocoupler Reliability[C]. 见:Prognostics and System Health Management Conference (PHM- Hunan). Lab Sci & Technol Integrated Logist Support, Zhangjiajie, PEOPLES R CHINA.
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