| Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM | |
| Kang, Wang; Li, Zheng; Wang, Zhaohao; Deng, Erya; Klein, Jacques-Olivier; Zhang, Youguang; Chappert, Claude; Ravelosona, Dafine; Zhao, Weisheng | |
| 刊名 | IEEE TRANSACTIONS ON MAGNETICS
 |
| 2014 | |
| 卷号 | 50 |
| 关键词 | High reliability nonvolatile process variation sensing circuit spin-transfer torgue magnetic RAM (STT-MRAM) |
| ISSN号 | 0018-9464 |
| DOI | 10.1109/TMAG.2014.2321551 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| WOS记录号 | WOS:000349465900228 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6548136 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Kang, Wang,Li, Zheng,Wang, Zhaohao,et al. Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM[J]. IEEE TRANSACTIONS ON MAGNETICS,2014,50. |
| APA | Kang, Wang.,Li, Zheng.,Wang, Zhaohao.,Deng, Erya.,Klein, Jacques-Olivier.,...&Zhao, Weisheng.(2014).Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM.IEEE TRANSACTIONS ON MAGNETICS,50. |
| MLA | Kang, Wang,et al."Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM".IEEE TRANSACTIONS ON MAGNETICS 50(2014). |
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