Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN | |
Sun WH ; Chen KM ; Yang ZJ ; Li J ; Tong YZ ; Jin SX ; Zhang GY ; Zhang QL ; Qin GG | |
刊名 | journal of applied physics
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1999 | |
卷号 | 85期号:9页码:6430-6433 |
关键词 | RESONANT RAMAN-SCATTERING HYDROGEN CARBON FILMS GAAS ABSORPTION GROWTH |
ISSN号 | 0021-8979 |
通讯作者 | qin gg,peking univ,dept phys,beijing 100871,peoples r china. |
中文摘要 | both fourier transform infrared (ftir) grazing incidence reflectivity and ftir transmission methods have been used to study gan films grown on alpha-al2o3 (0001) substrates by atmospheric pressure metal-organic chemical vapor deposition and low pressure metal-organic chemical vapor deposition. the results show that in the frequency range from 400 to 3500 cm(-1) the signal-to-noise ratio of the ftir grazing incidence measurement is far higher than that of the ftir transmission measurement. some new vibrational structures appearing in the former measurement have been discussed. the features around 1460 and 1300 cm(-1) are tentatively assigned to scissoring and wagging local vibrational modes of ch2 in gan, respectively. (c) 1999 american institute of physics. [s0021-8979(99)06509-3]. |
学科主题 | 半导体物理 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-08-12 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/12944] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Sun WH,Chen KM,Yang ZJ,et al. Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN[J]. journal of applied physics,1999,85(9):6430-6433. |
APA | Sun WH.,Chen KM.,Yang ZJ.,Li J.,Tong YZ.,...&Qin GG.(1999).Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN.journal of applied physics,85(9),6430-6433. |
MLA | Sun WH,et al."Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN".journal of applied physics 85.9(1999):6430-6433. |
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