Scanning electron microscope studies of cubic AlxGa1-xN films grown on GaAs(100) by metal organic vapor phase epitaxy (MOVPE)
Zhao DG
刊名journal of crystal growth
1999
卷号203期号:1-2页码:40-44
关键词AlGaN cubic hexagonal SEM MOVPE GAAS GAN
ISSN号0022-0248
通讯作者xu dp,chinese acad sci,inst semicond,natl res ctr optoelect technol,beijing 100083,peoples r china.
中文摘要cubic algan films were grown on gaas(100) substrates by movpe. scanning electron microscope and photoluminescence were used to analyze the surface morphology and the crystalline quality of the epitaxial layers. we found that both nh, and tega fluxes have a strong effect on the surface morphology of algan films. a model for the lateral growth mechanism is presented to qualitatively explain this effect. the content of hexagonal algan in the cubic algan films was also related to the nh3 flux. (c) 1999 elsevier science b.v. all rights reserved.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-08-12
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/12908]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Zhao DG. Scanning electron microscope studies of cubic AlxGa1-xN films grown on GaAs(100) by metal organic vapor phase epitaxy (MOVPE)[J]. journal of crystal growth,1999,203(1-2):40-44.
APA Zhao DG.(1999).Scanning electron microscope studies of cubic AlxGa1-xN films grown on GaAs(100) by metal organic vapor phase epitaxy (MOVPE).journal of crystal growth,203(1-2),40-44.
MLA Zhao DG."Scanning electron microscope studies of cubic AlxGa1-xN films grown on GaAs(100) by metal organic vapor phase epitaxy (MOVPE)".journal of crystal growth 203.1-2(1999):40-44.
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