| Chaotic binary bat algorithm for analog test point selection | |
| Zhao, Dongsheng; He, Yuzhu | |
| 刊名 | ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
 |
| 2015 | |
| 卷号 | 84页码:201-214 |
| 关键词 | Analog fault diagnosis Test point selection Chaotic maps Bat algorithm (BA) Binary bat algorithm (BBA) Chaotic binary bat algorithm (CBBA) |
| ISSN号 | 0925-1030 |
| DOI | 10.1007/s10470-015-0548-5 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| WOS记录号 | WOS:000357458100005 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6538937 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Zhao, Dongsheng,He, Yuzhu. Chaotic binary bat algorithm for analog test point selection[J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING,2015,84:201-214. |
| APA | Zhao, Dongsheng,&He, Yuzhu.(2015).Chaotic binary bat algorithm for analog test point selection.ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING,84,201-214. |
| MLA | Zhao, Dongsheng,et al."Chaotic binary bat algorithm for analog test point selection".ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 84(2015):201-214. |
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