Bayesian optimal design of step stress accelerated degradation testing | |
Li, Xiaoyang; Rezvanizaniani, Mohammad; Ge, Zhengzheng; Abuali, Mohamed; Lee, Jay | |
刊名 | JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS |
2015 | |
卷号 | 26页码:502-513 |
关键词 | accelerated testing Bayesian theory KL divergence degradation optimal design battery |
ISSN号 | 1004-4132 |
DOI | 10.1109/JSEE.2015.00058 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI ; CSCD |
WOS记录号 | WOS:000358464900010 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6538286 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Li, Xiaoyang,Rezvanizaniani, Mohammad,Ge, Zhengzheng,et al. Bayesian optimal design of step stress accelerated degradation testing[J]. JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS,2015,26:502-513. |
APA | Li, Xiaoyang,Rezvanizaniani, Mohammad,Ge, Zhengzheng,Abuali, Mohamed,&Lee, Jay.(2015).Bayesian optimal design of step stress accelerated degradation testing.JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS,26,502-513. |
MLA | Li, Xiaoyang,et al."Bayesian optimal design of step stress accelerated degradation testing".JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS 26(2015):502-513. |
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