Simple reflection technique for measuring the linear electro-optic coefficient of the polymer thin films | |
Shi W ; Fang CS ; Pan QW ; Meng FQ ; Gu QT ; Xu D ; Chen GJ ; Yu JZ | |
刊名 | acta physica sinica
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2000 | |
卷号 | 49期号:2页码:262-266 |
关键词 | POLED POLYMER CHROMOPHORES |
ISSN号 | 1000-3290 |
通讯作者 | shi w,shandong univ,state key lab crystal mat,jinan 250100,peoples r china. |
中文摘要 | the simple reflection technique is usually used to measure the linear electro-optic (eo) coefficient (pockels coefficient) in the development of eo polymer thin films. but there are some problems in some articles in the determination of the phase shift between the s and p light modes of a laser beam waveguided into the polymer film while a modulating voltage is applied across the electrodes, and different expressions for the linear eo coefficient measured have been given in these articles. in our research, more accurate expression of the linear eo coefficient was deduced by suitable considering the phase shift between the s and p light modes. the linear eo coefficients of several polymer thin films were measured by reflection technique, and the results of the linear eo coefficient calculated by different expressions were compared. the limit of the simple reflection technique for measuring the linear eo coefficient of the polymer thin films was discussed. |
学科主题 | 半导体物理 |
收录类别 | SCI |
语种 | 中文 |
公开日期 | 2010-08-12 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/12706] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Shi W,Fang CS,Pan QW,et al. Simple reflection technique for measuring the linear electro-optic coefficient of the polymer thin films[J]. acta physica sinica,2000,49(2):262-266. |
APA | Shi W.,Fang CS.,Pan QW.,Meng FQ.,Gu QT.,...&Yu JZ.(2000).Simple reflection technique for measuring the linear electro-optic coefficient of the polymer thin films.acta physica sinica,49(2),262-266. |
MLA | Shi W,et al."Simple reflection technique for measuring the linear electro-optic coefficient of the polymer thin films".acta physica sinica 49.2(2000):262-266. |
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