Measurement of a reciprocal four-port transmission line structure using the 16-term error model

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	Measurement of a reciprocal four-port transmission line structure using the 16-term error model
	Zhang Y (Zhang, Yun) ; Silvonen K (Silvonen, Kirnmo) ; Zhu NH (Zhu, Ning H.)
刊名	microwave and optical technology letters
	2007
卷号	49 期号:7 页码:1511-1515
关键词	16-term error model
ISSN号	issn: 0895-2477
通讯作者	zhang, y, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china.
中文摘要	a new method to measure reciprocal four-port structures, using a 16-term error model, is presented. the measurement is based on 5 two-port calibration standards connected to two of the ports, while the network analyzer is connected to the two remaining ports. least-squares-fit data reduction techniques are used to lower error sensitivity. the effect of connectors is deembedded using closed-form equations. (c) 2007 wiley periodicals, inc.
学科主题	光电子学
收录类别	SCI
语种	英语
公开日期	2010-03-29
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/9442]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Zhang Y ,Silvonen K ,Zhu NH . Measurement of a reciprocal four-port transmission line structure using the 16-term error model[J]. microwave and optical technology letters,2007,49(7):1511-1515.
APA	Zhang Y ,Silvonen K ,&Zhu NH .(2007).Measurement of a reciprocal four-port transmission line structure using the 16-term error model.microwave and optical technology letters,49(7),1511-1515.
MLA	Zhang Y ,et al."Measurement of a reciprocal four-port transmission line structure using the 16-term error model".microwave and optical technology letters 49.7(2007):1511-1515.