Silica and alumina thin films grown by liquid phase deposition
Sun, J ; Hu, LZ ; Wang, ZY ; Du, GT
刊名pricm 5: the fifth pacific rim international conference on advanced materials and processing
2005
卷号pts 1-5期号:475-479页码:1725-1728
关键词silica alumina liquid phase deposition semiconductors ELECTRICAL CHARACTERISTICS DIOXIDE FILMS OXIDE-FILMS
ISSN号0255-5476
通讯作者sun, j, dalian univ technol, dept phys, dalian 116023, peoples r china. 电子邮箱地址: albertjefferson@sohu.com ; bandaoti@dlut.edu.cn
中文摘要this work demonstrates the condition optimization during liquid phase deposition (lpd) of sio2/gaas films. lpd method is further applied to form al2o3 films on semiconductors with poison-free materials. proceeding at room temperature with inexpensive equipment, lpd of silica and alumina films is potentially serviceable in microelectronics and related spheres.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-03-17
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/8762]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Sun, J,Hu, LZ,Wang, ZY,et al. Silica and alumina thin films grown by liquid phase deposition[J]. pricm 5: the fifth pacific rim international conference on advanced materials and processing,2005,pts 1-5(475-479):1725-1728.
APA Sun, J,Hu, LZ,Wang, ZY,&Du, GT.(2005).Silica and alumina thin films grown by liquid phase deposition.pricm 5: the fifth pacific rim international conference on advanced materials and processing,pts 1-5(475-479),1725-1728.
MLA Sun, J,et al."Silica and alumina thin films grown by liquid phase deposition".pricm 5: the fifth pacific rim international conference on advanced materials and processing pts 1-5.475-479(2005):1725-1728.
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