Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability

	Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability
	Li, XL ; Rao, F ; song, zt(重点实验室） ; Ren, K ; Liu, WL ; Sun, ZM
刊名	APPLIED SURFACE SCIENCE
	2011
卷号	257 期号:10 页码:4566-4568
关键词	Chemistry Materials Science Physics Physics Physical Coatings & Films Applied Condensed Matter
ISSN号	0169-4332
学科主题	Chemistry; Materials Science; Physics
收录类别	SCI
原文出处	10.1016/j.apsusc.2010.12.017
语种	英语
公开日期	2013-05-10
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/115504]
专题	上海微系统与信息技术研究所_信息功能材料国家重点实验室2008-2012_期刊论文
推荐引用方式 GB/T 7714	Li, XL,Rao, F,song, zt,et al. Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability[J]. APPLIED SURFACE SCIENCE,2011,257(10):4566-4568.
APA	Li, XL,Rao, F,song, zt,Ren, K,Liu, WL,&Sun, ZM.(2011).Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability.APPLIED SURFACE SCIENCE,257(10),4566-4568.
MLA	Li, XL,et al."Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability".APPLIED SURFACE SCIENCE 257.10(2011):4566-4568.