Defect evolution and accompanied change of electrical properties during the GaN growth by metalorganic chemical vapor deposition | |
Zhang SM![]() ![]() ![]() ![]() ![]() ![]() | |
刊名 | journal of alloys and compounds
![]() |
2009 | |
卷号 | 487期号:1-2页码:400-403 |
关键词 | Nitride materials |
ISSN号 | 0925-8388 |
通讯作者 | zhao, dg, chinese acad sci, inst semicond, state key lab integrated optoelect, pob 912, beijing 100083, peoples r china. 电子邮箱地址: dgzhao@red.semi.ac.cn |
中文摘要 | the defect evolution and its correlation with electrical properties of gan films grown by metalorganic chemical vapor deposition are investigated. it is found that the dislocation density decreases gradually during the growth process, and the dislocation reduction rate in the island coalescence process is especially rapid. the changes in electron mobility of gan with the increase of growth time are mainly dependent on the dislocations acting as scattering centers. furthermore, the variation of carrier concentration in gan may be related with the point defects and their clusters. the quality of gan could be improved by suitably increasing the film thickness. (c) 2009 elsevier b.v. all rights reserved. |
学科主题 | 半导体化学 |
收录类别 | SCI |
资助信息 | national natural science foundation of china 60836003 60776047605060016047602160576003national basic research program of china 2007cb936700 national high technology research and development program of china 2007aa03z401 |
语种 | 英语 |
公开日期 | 2010-03-08 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/7495] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Zhang SM,Jiang DS,Zhu JJ,et al. Defect evolution and accompanied change of electrical properties during the GaN growth by metalorganic chemical vapor deposition[J]. journal of alloys and compounds,2009,487(1-2):400-403. |
APA | Zhang SM.,Jiang DS.,Zhu JJ.,Guo X.,Wang YT.,...&Zhao DG.(2009).Defect evolution and accompanied change of electrical properties during the GaN growth by metalorganic chemical vapor deposition.journal of alloys and compounds,487(1-2),400-403. |
MLA | Zhang SM,et al."Defect evolution and accompanied change of electrical properties during the GaN growth by metalorganic chemical vapor deposition".journal of alloys and compounds 487.1-2(2009):400-403. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论