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	Effect of La doping on structural and electrical properties of Bi2Ti2O7 thin films
	Yang, XN; Huang, BB; Wang, HB; Shang, SX; Yao, WF; Wei, JY
刊名	JOURNAL OF CRYSTAL GROWTH
	2004
卷号	270期号:1-2页码:98-101
关键词	X-ray diffraction polycrystalline deposition dielectric materials
DOI	10.1016/j.jcrysgro.2004.05.103
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6336957
专题	山东大学
作者单位	1.Shandong Univ, Sate Key Lab Crystal Mat, Jinan 250100, Peoples R China. 2.[Yang, X
推荐引用方式 GB/T 7714	Yang, XN,Huang, BB,Wang, HB,et al. Effect of La doping on structural and electrical properties of Bi2Ti2O7 thin films[J]. JOURNAL OF CRYSTAL GROWTH,2004,270(1-2):98-101.
APA	Yang, XN,Huang, BB,Wang, HB,Shang, SX,Yao, WF,&Wei, JY.(2004).Effect of La doping on structural and electrical properties of Bi2Ti2O7 thin films.JOURNAL OF CRYSTAL GROWTH,270(1-2),98-101.
MLA	Yang, XN,et al."Effect of La doping on structural and electrical properties of Bi2Ti2O7 thin films".JOURNAL OF CRYSTAL GROWTH 270.1-2(2004):98-101.

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