Valence band offset of ZnO/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy

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	Valence band offset of ZnO/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy
	Jia CH; Zhou XL
刊名	journal of physics d-applied physics
	2009
卷号	42 期号:9 页码:art. no. 095305
ISSN号	0022-3727
通讯作者	jia ch chinese acad sci inst semicond key lab semicond mat sci pob 912 beijing 100083 peoples r china. e-mail address: yhchen@red.semi.ac.cn
中文摘要	x-ray photoelectron spectroscopy has been used to measure the valence band offset (vbo) of the zno/srtio3 heterojunction. it is found that a type-ii band alignment forms at the interface. the vbo and conduction band offset (cbo) are determined to be 0.62 +/- 0.23 and 0.79 +/- 0.23 ev, respectively. the directly obtained vbo value is in good agreement with the result of theoretical calculations based on the interface-induced gap states and the chemical electronegativity theory. furthermore, the cbo value is also consistent with the electrical transport investigations.
学科主题	半导体材料
收录类别	SCI
资助信息	973 program 2006cb604908 2006cb921607 national natural science foundation of china 60625402 this work was supported by the 973 program (2006cb604908, 2006cb921607), and the national natural science foundation of china (60625402).
语种	英语
公开日期	2010-03-08
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/7229]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Jia CH,Zhou XL. Valence band offset of ZnO/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy[J]. journal of physics d-applied physics,2009,42(9):art. no. 095305.
APA	Jia CH,&Zhou XL.(2009).Valence band offset of ZnO/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy.journal of physics d-applied physics,42(9),art. no. 095305.
MLA	Jia CH,et al."Valence band offset of ZnO/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy".journal of physics d-applied physics 42.9(2009):art. no. 095305.