Band alignment of InN/GaAs heterojunction determined by x-ray photoelectron spectroscopy

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	Band alignment of InN/GaAs heterojunction determined by x-ray photoelectron spectroscopy
	Zhang, RQ ; Guo, Y ; Song, HP ; Liu, XL ; Yang, SY ; Wei, HY ; Zhu, QS ; Wang, ZG
刊名	applied physics letters
	2008
卷号	93 期号:12 页码:art. no. 122111
关键词	PHOTOEMISSION SPECTROSCOPY GAP STATES CONTINUUM LINEUPS INN
ISSN号	0003-6951
通讯作者	zhang, rq, chinese acad sci, inst semicond, key lab semicond mat sci, pob 912, beijing 100083, peoples r china. 电子邮箱地址: zhangriq@semi.ac.cn ; xlliu@semi.ac.cn
中文摘要	the valence band offset (vbo) of the inn/gaas heterojunction is directly determined by x-ray photoelectron spectroscopy to be 0.94 +/- 0.23 ev. the conduction band offset is deduced from the known vbo value to be 1.66 +/- 0.23 ev, and a type-ii band alignment forms at the inn/gaas heterojunction. (c) 2008 american institute of physics.
学科主题	半导体物理
收录类别	SCI
资助信息	national science foundation of china 60506002 60776015special funds for major state basic research project (973 program) of china 2006cb60490 863 high technology r&d program of china 2007aa03z402 2007aa03z451 this work was supported by the national science foundation of china (nos. 60506002 and 60776015), the special funds for major state basic research project (973 program) of china (no. 2006cb60490), and the 863 high technology r&d program of china (nos. 2007aa03z402 and 2007aa03z451).
语种	英语
公开日期	2010-03-08
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/6436]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Zhang, RQ,Guo, Y,Song, HP,et al. Band alignment of InN/GaAs heterojunction determined by x-ray photoelectron spectroscopy[J]. applied physics letters,2008,93(12):art. no. 122111.
APA	Zhang, RQ.,Guo, Y.,Song, HP.,Liu, XL.,Yang, SY.,...&Wang, ZG.(2008).Band alignment of InN/GaAs heterojunction determined by x-ray photoelectron spectroscopy.applied physics letters,93(12),art. no. 122111.
MLA	Zhang, RQ,et al."Band alignment of InN/GaAs heterojunction determined by x-ray photoelectron spectroscopy".applied physics letters 93.12(2008):art. no. 122111.