Interface as the origin of ferromagnetism in cobalt doped ZnO film grown on silicon substrate
Yin ZG; Zhang XW
刊名applied physics letters
2008
卷号93期号:14页码:art. no. 142109
关键词MAGNETIC-PROPERTIES
ISSN号0003-6951
通讯作者yin, zg, chinese acad sci, inst semicond, key lab semicond mat sci, beijing 100083, peoples r china. 电子邮箱地址: yzhg@semi.ac.cn
中文摘要we have investigated the magnetic properties of co-doped zinc oxide (zno) film deposited on silicon substrate by magnetron sputtering. co ions have a valence of 2+ and substitute for zn sites in the lattice. by using a chemical etching method, an extrinsic ferromagnetism was demonstrated. the observed ferromagnetism is neither associated with magnetic precipitates nor with contamination, but originates from the silicon/silicon oxide interface. this interface ferromagnetism is characterized by being temperature independent and by having a parallel magnetic anisotropy. (c) 2008 american institute of physics. [doi: 10.1063/1.2989128]
学科主题半导体物理
收录类别SCI
资助信息special funds for major state basic research projects 2002cb311905 national natural science foundation of china 60576010 this work was partly supported by the special funds for major state basic research projects (2002cb311905) and by the national natural science foundation of china (grant no. 60576010)
语种英语
公开日期2010-03-08
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/6420]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Yin ZG,Zhang XW. Interface as the origin of ferromagnetism in cobalt doped ZnO film grown on silicon substrate[J]. applied physics letters,2008,93(14):art. no. 142109.
APA Yin ZG,&Zhang XW.(2008).Interface as the origin of ferromagnetism in cobalt doped ZnO film grown on silicon substrate.applied physics letters,93(14),art. no. 142109.
MLA Yin ZG,et al."Interface as the origin of ferromagnetism in cobalt doped ZnO film grown on silicon substrate".applied physics letters 93.14(2008):art. no. 142109.
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