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	Improved turn-off capability of IGBT with LIHT structure
	Wu, Yuzhou; Li, Zehong; Cui, Xiaonan; Li, Zhaoji; Zeng, Xiao; Gao, Wei; Zhang, Jinping; Ren, Min; Zhang, Bo; Yang, Fashun
	2017
会议日期	July 4, 2017 - July 7, 2017
会议地点	Chengdu, China
会议录	24th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2017
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/6238459
专题	贵州大学
作者单位	1.[1] State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronics Science and Technology of China, Chengdu, China 2.[2] Guizhou University, Guiyang, China 3.[3] Chengdu University of Information Technology, Chengdu, China 4.[4] China West Normal University, Nanchong, China
推荐引用方式 GB/T 7714	Wu, Yuzhou,Li, Zehong,Cui, Xiaonan,et al. Improved turn-off capability of IGBT with LIHT structure[C]. 见:. Chengdu, China. July 4, 2017 - July 7, 2017.

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